IEC QUALITY ASSESSMENT SYSTEM (IECQ)
For rules and details of the IECQ visit www.iecq.org |
IECQ Certificate of Approval
Independent Testing Laboratory |
IECQ Certificate No.: | IECQ-L CEP 24.0001 | Issue No.: | 3 | Status: | Current |
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Supersedes: | IECQ-L CEP 24.0001 Issue 2 | Issue Date: | 2024/10/24 | Org. Issue: | 2024/03/11 |
CB Reference No.: | IECQ-L 2024.006 | Expiration: | 2027/03/10 | | |
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SHANGHAI JUYUE INSPECTION TECHNOLOGY CO., LTD.
2 Building, No. 1388, Zhangdong Road, Pudong New District, Shanghai
China
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The organization, facilities and procedures have been assessed by the IECQ Certification Body in accordance with IECQ 03-1 and IECQ 03-6 for issuance of this certificate and found to be in conformity with the applicable requirements of the IECQ Independent Testing Laboratory Assessment Program Requirements Scheme and in respect of ISO/IEC 17025:2017 for the testing of component product under the IECQ.
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Scope:
Electrical and electronic products/electronic semiconductor products, mainly contains visual inspection of appearance, Decap, SEM, Delayer, IV CURVE, InGaAs/OBRICH, PROBE, Cross-section, EDX.
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Issued by the Certification Body: China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI) Certification Body |
No. 76 West of Zhucun Avenue, Zhucun, Zengcheng District, Guangzhou 511370
China
Authorised Person:
Wan Juyong
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The validity of this certificate is maintained through on-going surveillance audits by the IECQ CB issuing this certificate. This Certificate of Conformity may be suspended or withdrawn in accordance with the
Rules of Procedure of the IECQ System and its Schemes.
This certificate and any schedule(s) may only be reproduced in full.
This certificate is not transferable and remains the property of the issuing IECQ CB.
The Status and authenticity of this certificate may be verified by visiting www.iecq.org.
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IECQ-L Rev. 10
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