IEC QUALITY ASSESSMENT SYSTEM (IECQ) covering Electronic Components, Assemblies, Related Materials and Processes
For rules and details of the IECQ visit www.iecq.org
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IECQ Certificate of Approval
Independent Testing Laboratory
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IECQ Certificate No.:
| IECQ-L ULTW 21.0001
| Issue No.:
| 2
| Status:
| Current
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Supersedes:
| IECQ-L ULTW 21.0001 Issue 1
| Issue Date:
| 2023/01/05
| Org. Issue:
| 2021/01/30
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CB Reference No.:
| 50600378 ITL
| Expiration:
| 2024/01/29
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VESP Technology Co., Ltd.
Area A, floor 1, Building 5, Mingzhu Industrial Park,
High-tech Zone, Hefei city,
Anhui Province,
China
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The organization, facilities and procedures have been assessed and found to comply with the applicable requirements for Independent Testing Laboratory organization approval, in support of the IECQ system, which is in accordance with the Basic Rules IECQ 01 and Rules of Procedure IECQ 03-6 "Independent Testing Laboratory Assessment Program Requirements" of the IEC Quality Assessment System for Electronic Components (IECQ) and applicable requirements of ISO/IEC 17025:2017 for the testing of electronic components under the IECQ.
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Scope:
Reliability testing and failure analysis of semiconductors. See attached schedule. See attached schedule.
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Issued by the Certification Body: DQS Group - DQS Taiwan Inc. |
8th Fl., 23, Yuan Huan West Road, Feng Yuan Dist., Taichung City
Taiwan
Authorised Person:
Rock Chang
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The validity of this certificate is maintained through on-going surveillance audits by the IECQ CB issuing this certificate. This Certificate of Conformity may be suspended or withdrawn in accordance with the
Rules of Procedure of the IECQ System and its Schemes.
This certificate and any schedule(s) may only be reproduced in full.
This certificate is not transferable and remains the property of the issuing IECQ CB.
The Status and authenticity of this certificate may be verified by visiting www.iecq.org.
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IECQ-L Rev. 10
- Attached Translation: none [ Add ]
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